Scanning Electron Microscopy Platform

     Contact :   Françoise PILLIER  +331 44 27 42 01                                                       

Equipment:

 

 

Scanning electron microscope with field emission gun (SEM-FEG) ULTRA 55 ZEISS equipped with energy-dispersive X-ray spectroscopy EDX Bruker QUANTAX and also with a electron backscatter diffraction EBSD

  • SEM-FEGSecondary electron (SE2, InLens)

 

  • Backscattered electron (AsB, EsB)

 

  • X-ray microanalysis (EDS)

 

  • EBSD

 

  • sputtering (Cressington 108)

 

  • Carbon coating (Cressington 208)

 

 

Secondary electron imaging

SE2Observation of sample topography with a secondary electron detector down to nanoscale.

 

 

Electrochemically synthesized polypyrrole nanowires  

(Electrochem. Commun. 2009, 11, 298).  

 

 

 

 Backscattered electron imaging

AsBObservation of the different phases of a sample depending on their atomic number  detecting of backscattered electrons

 

 

 

Welding between two aluminium alloys  

(2024 et 7475immersed in a 0.1M Na2SO4 solution)  

 

 

Elementary analysis

 

Qualitative and quantitative analysis (with standards) of the elements in the material and mapping

Spectrum

EDS1
Bronze B3
EDS3
Dark Phase Wt %
Cu 90.10%
Sn 9.90%
EDS2
Bright Phase   Wt  %
Cu   75.17 %
Sn 24.83%

 

Mapping

carto
Bronze B3 after 24h of immersion in NaCl 10,5M+1,3,4 thiadiazole 10mM

 

EBSD

Characterization of the crystallographic properties of  sample

EBSD
Nickel sample